A new imaging technique uncovers how electronic patterns in quantum materials evolve unevenly across space and temperature.

FRANKFURT. With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, the Goethe University in Frankfurt (Germany) is expanding its research ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

ZEISS has unveiled the new ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimized for demanding sample preparation. It provides a live, high-resolution “see ...

Researchers have built an upgraded quantum microscope that can map momentum-resolved tunneling spectra in graphene at room ...

Alfredo has a PhD in Astrophysics and a Master's in Quantum Fields and Fundamental Forces from Imperial College London. Alfredo has a PhD in Astrophysics and a Master's in Quantum Fields and ...

Larry Allard, principal scientist who helped pioneer the technology of the aberration-corrected electron microscope (ACEM) at Oak Ridge National Laboratory 20 years ago, will speak to Friends of ORNL ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

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ZEISS Crossbeam 750 ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing ...